Preparation and Study of Structural and Optical Properties of PbS:Cu Nanostructured Thin Films
DOI:
https://doi.org/10.51699/emjms.v26i3.21Keywords:
lead sulphide, pulsed laser deposited, xrd diffraction, optical properties, electrical propertiesAbstract
Thin films of lead sulfide (PbS) and various Cu mixing ratios (30%, 50%, and 70%) are used in this work. were made using the (PLD) method on glass substrates at a wavelength of 1064 nm and 600 mj of laser energy. X-ray diffraction experiments were used to determine the structural measurements for pure PbS, and other mixes present thin films demonstrated a face-centered-cubic structure. and discovered that the average grain size was 17.74 nm; this grew to 20.54 nm after combining with 30% Cd, 20.54 nm after mixing with 50% Cd, and 23.15 nm after mixing with 70% Cd. The optical characteristics of PbS thin films measured between 300 and 1100 nm in wavelength. For PbS thin films, the optical transmittance and transparency decrease as the o mixing ratio increases.The absorption coefficient rises as the mixing ratio does. When the mixing ratio is increased, the band gap for pure PbS thin film is 2.43, rises to 3.03, and thereafter falls to 2.01 and 1.5.
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